Characterization of the Si( 111 )-Ga interface using optical second-harmonic generation

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Title:	Characterization of the Si( 111 )-Ga interface using optical second-harmonic generation
Author(s):	Kelly, P.V.; Omahony, J.D.; Rasing, T.H.M. ; McGilp, J.F.
Publication year:	1991
Source:	Journal of Physics : Condensed Matter, vol. 3, (1991), pp. S193-S198
ISSN:	0953-8984
DOI:	http://dx.doi.org/10.1088/0953-8984/3/S/031
Publication type:	Article / Letter to editor
Please use this identifier to cite or link to this item : https://hdl.handle.net/2066/92696
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Subject:	Spectroscopy of Solids and Interfaces
Organization:	Spectroscopy of Solids and Interfaces
Journal title:	Journal of Physics : Condensed Matter
Volume:	vol. 3
Page start:	p. S193
Page end:	p. S198

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