Model-Based Testing of Electronic Passports

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Publication year
2009
Author(s)
Mostowski, W.I.
Poll, E.
Schmaltz, J.
Tretmans, J.
Wichers Schreur, R.J.M.
Publisher
Berlin : Springer Verlag
ISBN
9783642045691
In
Lecture Notes in Computer Science, (2009)Alpuente, M.; Cook, B.; Joubert, C. (ed.), Formal Methods for Industrial Critical Systems 2009,14th International Workshop, FMICS 2009, Eindhoven, The Netherlands, November 2-3, 2009, Proceedings, pp. 207-209
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DOI
Annotation
14th International Workshop, FMICS 2009, 02 november 2009
Publication type
Article in monograph or in proceedings
Please use this identifier to cite or link to this item: https://hdl.handle.net/2066/75281   https://hdl.handle.net/2066/75281
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