Formal Analysis of Empirical Traces in Incident Management

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Publication year
2004
Author(s)
Hoogendoorn, M.
Jonker, C.M.
Konur, S.
Maanen, P.P. van
Popova, V.
Sharpanskykh, A.
Treur, J.
Xu, L.
Yolum, P.
Publisher
London : Springer
ISBN
185233908X
In
Macintosh, A.; Ellis, R.; Allen, T. (ed.), Applications and Innovations in Intelligent Systems XII, Proceedings of AI-2004, the 24th SGAI International Conference on Innovative Techniques and Applications of Artificial Intelligence, pp. 237-250
Publication type
Part of book or chapter of book
Please use this identifier to cite or link to this item: https://hdl.handle.net/2066/64455   https://hdl.handle.net/2066/64455
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