Fulltext present in this item

Thumbnail
Fulltext: 60427.pdf
Format: PDF
Description: preprint version
Title: Model Checker Aided Design of a Controller for a Wafer Scanner
Author(s): Hendriks, M. ; Nieuwelaar, N.J.M. van den; Vaandrager, F.W.
Publication year: 2004
In: Margaria, T.; Steffen, B.; Philippou, A. (ed.), Preliminary Proceedings International Symposium on Leveraging Applications of Formal Methods (ISoLA 2004), rm October/November 2004, Paphos, Cyprus, pp. 201-209
Publisher: [S.l.] : Department of Computer Science, University of Cyprus
Publication type: Article in monograph or in proceedings

Please use this identifier to cite or link to this item : https://hdl.handle.net/2066/60427   https://hdl.handle.net/2066/60427

Display more details
Editor(s): Margaria, T.; Steffen, B.; Philippou, A.; Reitenspiess, M.
Subject: Informatics for Technical Applications
Organization: Informatics for Technical Applications
Book title: Margaria, T.; Steffen, B.; Philippou, A. (ed.), Preliminary Proceedings International Symposium on Leveraging Applications of Formal Methods (ISoLA 2004), rm October/November 2004, Paphos, Cyprus
Page start: p. 201
Page end: p. 209

This item appears in the following Collection(s)

Browse

Statistics