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Fulltext present in this item
Fulltext:
60423.pdf
Format:
PDF
Description:
preprint version
Title:
Model Checker Aided Design of a Controller for a Wafer Scanner
Author(s):
Hendriks, M.
;
Nieuwelaar, N.J.M. van den
;
Vaandrager, F.W.
Publication year:
2004
Publisher:
[S.l.] : NIII, University of Nijmegen
Number of Pages:
16 p.
Series:
Technical Report ; NIII-R0430
Publication type:
External research report
Please use this identifier to cite or link to this item :
https://hdl.handle.net/2066/60423
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Subject:
Informatics for Technical Applications
Organization:
Informatics for Technical Applications
This item appears in the following Collection(s)
Faculty of Science
[28589]
Open Access publications
[55384]
Freely accessible full text publications
Electronic publications
[85196]
Freely accessible full text publications plus those not yet available due to embargo
Academic publications
[186162]
Academic output Radboud University
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