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Characterization of solid-liquid interfaces using X-ray diffraction
Publication year
2005
Author(s)
Vlieg, E.
Source
Cheminform, 36, 49, (2005), pp. 1
ISSN
0931-7597
DOI
https://doi.org/10.1002/chin.200549278
Publication type
Article / Letter to editor
If a DOI or any other persistent identifier is unavailable, please use the following repository identifier to link to this item:
https://hdl.handle.net/2066/305838
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Organization
Solid State Chemistry
Journal title
Cheminform
Volume
vol. 36
Issue
iss. 49
Page start
p. 1
Page end
p. 1
Subject
Solid State Chemistry
This item appears in the following Collection(s)
Academic publications
[246936]
Faculty of Science
[38073]
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