Probing the silicon-silicon oxide interface of Si(111)-SiO2-Cr MOS structures by DC-electric-field-induced second harmonic generation
Publication year
1996Author(s)
Publisher
Elsevier science bv
Source
Surface Science, 352, (1996), pp. 1033-1037ISSN
Publication type
Article / Letter to editor

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Organization
Spectroscopy of Solids and Interfaces
Journal title
Surface Science
Volume
vol. 352
Page start
p. 1033
Page end
p. 1037
This item appears in the following Collection(s)
- Academic publications [202828]
- Electronic publications [100942]
- Faculty of Science [31868]
- Open Access publications [69659]
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