Probing the silicon-silicon oxide interface of Si(111)-SiO2-Cr MOS structures by DC-electric-field-induced second harmonic generation

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Publication year
1996
Author(s)
Aktsipetrov, O.A.
Fedyanin, A.A.
Mishina, E.D.
Rubtsov, A.N.
Hasselt, C.W. van
Devillers, M.A.C.
Rasing, T.H.M.
Publisher
Elsevier science bv
Source
Surface Science, 352, (1996), pp. 1033-1037
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Publication type
Article / Letter to editor
Please use this identifier to cite or link to this item: https://hdl.handle.net/2066/29614   https://hdl.handle.net/2066/29614
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