A Low-Temperature Scanning Tunneling Microscope for Use in High Magnetic-Fields
Publication year
1995Publisher
Amer inst physics
Source
Review of Scientific Instruments, 66, 8, (1995), pp. 4146-4149ISSN
Publication type
Article / Letter to editor
Display more detailsDisplay less details
Organization
Scanning Probe Microscopy
Journal title
Review of Scientific Instruments
Volume
vol. 66
Issue
iss. 8
Page start
p. 4146
Page end
p. 4149
This item appears in the following Collection(s)
- Academic publications [246425]
- Electronic publications [134061]
- Faculty of Science [37995]
- Open Access publications [107626]
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