Optimization of adhesion mode atomic force microscopy resolves individual molecules in topography and adhesion

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Publication year
1999
Author(s)
Willemsen, O.H.
Snel, M.M.E.
Noort, S.J.T. van
Werf, K.O. van der
Grooth, B.G. de
Figdor, C.G.
Greve, J.
Publisher
Elsevier science bv
Source
Ultramicroscopy, 80, 2, (1999), pp. 133-144
ISSN
Publication type
Article / Letter to editor
Please use this identifier to cite or link to this item: https://hdl.handle.net/2066/27073   https://hdl.handle.net/2066/27073
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