A Systematic Evaluation of Profiling Through Focused Feature Selection
Publication year
2019Source
IEEE Transactions on Very Large Scale Integration (VLSI) Systems, 27, 12, (2019), pp. 2802-2815ISSN
Publication type
Article / Letter to editor

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Organization
Digital Security
Journal title
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
Volume
vol. 27
Issue
iss. 12
Page start
p. 2802
Page end
p. 2815
Subject
Digital SecurityThis item appears in the following Collection(s)
- Academic publications [227881]
- Electronic publications [107344]
- Faculty of Science [33782]
- Open Access publications [76470]
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