A Systematic Evaluation of Profiling Through Focused Feature Selection

Thumbnail
Fulltext:
210202.pdf
Size:
2.678Mb
Format:
PDF
Description:
postprint version
Download
Thumbnail
Fulltext:
210202.pdf
Size:
2.592Mb
Format:
PDF
Description:
Publisher’s version
Download
Publication year
2019
Author(s)
Picek, S.
Heuser, A.
Jovic, A.
Batina, L.
Source
IEEE Transactions on Very Large Scale Integration (VLSI) Systems, 27, 12, (2019), pp. 2802-2815
ISSN
DOI
Publication type
Article / Letter to editor
Please use this identifier to cite or link to this item: https://hdl.handle.net/2066/210202   https://hdl.handle.net/2066/210202
Display more details

Upload full text

Use your RU credentials (u/z-number and password) to log in with SURFconext to upload a file for processing by the repository team.