Optimization of adhesion mode atomic force microscopy resolves individual molecules in topography and adhesion

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Publication year
1999
Author(s)
Willemsen, O.H.
Snel, M.
Noort, J.M. van
Werf, K.O.
Groot, B.G. de
Figdor, C.G.
Greve, J. de
Source
Ultramicroscopy, 80, 2, (1999), pp. 133-144
ISSN
DOI
Publication type
Article / Letter to editor
Please use this identifier to cite or link to this item: https://hdl.handle.net/2066/188719   https://hdl.handle.net/2066/188719
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