Symbolic Complexity Analysis using Context-preserving Histories

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Publication year
2017
Author(s)
Luckow, K.
Kersten, R.W.J.
Pasareanu, C.
Publisher
Los Alamitos : IEEE
ISBN
9781509060313
In
Bilof, R. (ed.), ICST 2017: 10th IEEE International Conference on Software Testing, Verification and Validation, 13-17 March 2017, Tokyo, Japan. Proceedings, pp. 58-68
DOI
Annotation
ICST 2017: 10th IEEE International Conference on Software Testing, Verification and Validation, 13-17 March 2017, Tokyo, Japan
Publication type
Article in monograph or in proceedings
Please use this identifier to cite or link to this item: https://hdl.handle.net/2066/178477   https://hdl.handle.net/2066/178477
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