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Publication year
2006Source
Japanese Journal of Applied Physics, 45, 3B, (2006), pp. 2225-2229ISSN
Publication type
Article / Letter to editor

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Organization
Scanning Probe Microscopy
Journal title
Japanese Journal of Applied Physics
Volume
vol. 45
Issue
iss. 3B
Page start
p. 2225
Page end
p. 2229
Subject
Scanning Probe MicroscopyThis item appears in the following Collection(s)
- Academic publications [232278]
- Electronic publications [115491]
- Faculty of Science [34959]
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