Author(s):
|
Huisman, T.J.; Mikhaylovskiy, R.; Costa, J.D.; Freimuth, F.; Paz, E.; Ventura, J.; Freitas, P.P.; Blugel, S.; Mokrousov, Y.;
Rasing, T.H.M.
;
Kimel, A.V.
|
Subject:
|
Spectroscopy of Solids and Interfaces |
Organization:
|
Spectroscopy of Solids and Interfaces |