Selective photoetching and transmission electron microscopy studies of defects in heteroepitaxial GaN

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Publication year
2001
Author(s)
Weyher, J.L.
Tichelaar, F.D.
Zandbergen, H.W.
Macht, L.
Hageman, P.R.
Source
Journal of Applied Physics, 90, 12, (2001), pp. 6105-6109
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Publication type
Article / Letter to editor
Please use this identifier to cite or link to this item: https://hdl.handle.net/2066/112559   https://hdl.handle.net/2066/112559
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