Application of genetic algorithms for characterization of thin layered materials by glancing incidence X-ray reflectometry

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Publication year
1998
Author(s)
Dane, A.D.
Veldhuis, A.
Boer, D.K.G. de
Leenaers, A.J.G.
Buydens, L.M.C.
Source
Physica B - Condensed Matter, 253, 3-4, (1998), pp. 254-268
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Publication type
Article / Letter to editor
Please use this identifier to cite or link to this item: https://hdl.handle.net/2066/112395   https://hdl.handle.net/2066/112395
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