Early Fault Detection in Industry Using Models at Various Abstraction Levels

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Publication year
2012
Author(s)
Hooman, J.
Mooij, A. de
Wezep, H. van
Publisher
Berlin : Springer
Series
Lecture Notes in Computer Science ; 7321
ISBN
9783642307287
In
Derrick, J.; Gnesi, S.; Latella, D. (ed.), Integrated Formal Methods, pp. 268-282
DOI
Publication type
Part of book or chapter of book
Please use this identifier to cite or link to this item: https://hdl.handle.net/2066/103314   https://hdl.handle.net/2066/103314
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