Early Fault Detection in Industry Using Models at Various Abstraction Levels

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Title:	Early Fault Detection in Industry Using Models at Various Abstraction Levels
Author(s):	Hooman, J. ; Mooij, A. de; Wezep, H. van
Publication year:	2012
In:	Derrick, J.; Gnesi, S.; Latella, D. (ed.), Integrated Formal Methods, pp. 268-282
Publisher:	Berlin : Springer
ISBN:	9783642307287
Series:	Lecture Notes in Computer Science ; 7321
DOI:	http://dx.doi.org/10.1007/978-3-642-30729-4_19
Publication type:	Part of book or chapter of book
Please use this identifier to cite or link to this item : http://hdl.handle.net/2066/103314
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Editor(s):	Derrick, J.; Gnesi, S.; Latella, D.; Treharne, H.
Subject:	Software Science
Organization:	Software Science
Book title:	Derrick, J.; Gnesi, S.; Latella, D. (ed.), Integrated Formal Methods
Page start:	p. 268
Page end:	p. 282