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Farkouh, M.E.; Kirshner, H.; Harrington, R.A.; Ruland, S.; Verheugt, F.W.A. ; Schnitzer, T.J.; Burmester, G.R.; Mysler, E.; Hochberg, M.C.; Doherty, M.; et al.
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Patrono, C.; Bachmann, F.; Baigent, C.; Bode, C.; Caterina, R. de; Charbonnier, B.; Fitzgerald, D.; Hirsh, J.; Husted, S.; Kvasnicka, J.; et al.
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Curtis, J.P.; Alexander, J.H.; Huang, Y.H.; Wallentin, L.; Verheugt, F.W.A. ; Armstrong, P.W.; Krumholz, H.M.; Werf, F. van de; Danays, T.; Cheeks, M.; et al.
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Patrono, C.; Bachmann, F.; Baigent, C.; Bode, C.; Caterina, R. de; Charbonnier, B.; Fitzgerald, D.; Hirsh, J.; Husted, S.; Kvasnicka, J.; et al.
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Blazing, M.A.; Lemos, J.A. de; White, H.D.; Fox, K.; Verheugt, F.W.A. ; Ardissino, D.; DiBattiste, P.M.; Palmisano, J.; Bilheimer, D.W.; Snapinn, S.M.; et al.
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Sick, P.B.; Gelbrich, G.; Kalnins, U.; Erglis, A.; Bonan, R.; Aengevaeren, W.R.M. ; Elsner, D.; Lauer, B.; Woinke, M.; Brosteanu, O.; et al.
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Patrono, C.; Bachmann, F.; Baigent, C.; Bode, C.; Caterina, R. de; Charbonnier, B.; Fitzgerald, D.; Hirsh, J.; Husted, S.; Kvasnicka, J.; et al.
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