DSpace

DSpace at RU >    University Library >    Academic bibliography >

SFX Query

Files in This Item:

File Description SizeFormat
publisher's version208.55 kBAdobe PDFView/Open

Title: Field and temperature induced effects in the surface modification process
Author(s): Csonka, S.
Halbritter, A.
Mihaly, G.
Jurdik, E.
Shklyarevskiy, O.I. (271429119)
Speller, S.E. (298978156)
Kempen, H. van (138451109)
Publication year: 2004
Document type: Article / Letter to editor
Journal: Journal of Applied Physics
ISSN: 0021-8979
Volume: vol. 96
Issue: iss. 11
Start page: p. 6169
End page: p. 6174
Abstract: We used the mechanically controllable break junction technique to discriminate between the electric field and temperature effects in the process of surface modification. The electric field strength at the surface of electrodes was accurately determined using the field emission resonance spectra and was gradually raised to the point where surface modification starts. We found that only a limited number of metals with large values of the work function, greater than or similar to4.5-5 eV, and evaporation fields, less than or similar to1.5-2 V/Angstrom, can be modified in this way. Adsorption of He on the surface drastically increases the local work function of material and enables the field induced nanostructuring of the electrode surface practically for all metals. (C) 2004 American Institute of Physics.
Subject: Scanning Probe Microscopy
Organization: UMCN Extern
Scanning Probe Microscopy
Appears in Collections:Academic bibliography

Please use this identifier to cite or link to this item: http://hdl.handle.net/2066/58476

Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.

 

  DSpace Software Copyright © 2002-2011  Duraspace - Feedback