Model Checker Aided Design of a Controller for a Wafer Scanner

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Title:	Model Checker Aided Design of a Controller for a Wafer Scanner
Author(s):	Hendriks, M. ; Nieuwelaar, N.J.M. van den; Vaandrager, F.W.
Publication year:	2006
Source:	International Journal on Software Tools for Technology Transfer, vol. 8, iss. 6, (2006), pp. 633-647
ISSN:	1433-2779
Related links:	http://repository.ubn.ru.nl/bitstream/2066/35654/1/35654.pdf
Publication type:	Article / Letter to editor
Please use this identifier to cite or link to this item : http://hdl.handle.net/2066/35654
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Subject:	Informatics for Technical Applications
Organization:	Informatics for Technical Applications
Journal title:	International Journal on Software Tools for Technology Transfer
Volume:	vol. 8
Issue:	iss. 6
Page start:	p. 633
Page end:	p. 647

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