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Fulltext present in this item
Fulltext:
35654.pdf
Format:
PDF
Description:
preprint version
Title:
Model Checker Aided Design of a Controller for a Wafer Scanner
Author(s):
Hendriks, M.
;
Nieuwelaar, N.J.M. van den
;
Vaandrager, F.W.
Publication year:
2006
Source:
International Journal on Software Tools for Technology Transfer, vol. 8, iss. 6, (2006), pp. 633-647
ISSN:
1433-2779
Related links:
http://repository.ubn.ru.nl/bitstream/2066/35654/1/35654.pdf
Publication type:
Article / Letter to editor
Please use this identifier to cite or link to this item :
http://hdl.handle.net/2066/35654
Display more details
Subject:
Informatics for Technical Applications
Organization:
Informatics for Technical Applications
Journal title:
International Journal on Software Tools for Technology Transfer
Volume:
vol. 8
Issue:
iss. 6
Page start:
p. 633
Page end:
p. 647
This item appears in the following Collection(s)
Faculty of Science
[23834]
Open Access publications
[43632]
Freely accessible full text publications
Electronic publications
[68045]
Freely accessible full text publications plus those not yet available due to embargo
Academic publications
[154652]
Academic output Radboud University
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