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Title: Model Checker Aided Design of a Controller for a Wafer Scanner
Author(s): Hendriks, M. ; Nieuwelaar, N.J.M. van den; Vaandrager, F.W.
Publication year: 2006
Source: International Journal on Software Tools for Technology Transfer, vol. 8, iss. 6, (2006), pp. 633-647
ISSN: 1433-2779
Publication type: Article / Letter to editor

Please use this identifier to cite or link to this item : http://hdl.handle.net/2066/35654   http://hdl.handle.net/2066/35654

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Subject: Informatics for Technical Applications
Organization: Informatics for Technical Applications
Journal title: International Journal on Software Tools for Technology Transfer
Volume: vol. 8
Issue: iss. 6
Page start: p. 633
Page end: p. 647

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