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 | publisher's version | 1.7 MB | Adobe PDF | Under Embargo
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| Title: | Defect formation in GaN grown on vicinal 4H-SiC (0001) substrates |
| Author(s): | Rudzinski, M. (308288882)
Jezierska, E.
Weyher, J.L. (305358316)
Macht, L.
Hageman, P.R. (106962205)
Borysiuk, J.
Rodle, T.C.
Jos, H.F.F. (072271930) |
| Publication year: | 2007 |
| Document type: | Article / Letter to editor |
| Journal: | Physica status solidi A applications and materials science |
| ISSN: | 0031-8965 |
| Volume: | vol. 204 |
| Issue: | iss. 12 |
| Start page: | p. 4230 |
| End page: | p. 4240 |
| Subject: | Applied Materials Science |
| Organization: | Applied Materials Science |
| Appears in Collections: | Academic bibliography
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Please use this identifier to cite or link to this item:
http://hdl.handle.net/2066/34898
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