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Browsing by Author Borysiuk, J.
Showing results 1 to 8 of 8
| Full Text | Issue Date | Title | Author(s) | | 2007 | Defect formation in GaN grown on vicinal 4H-SiC (0001) substrates | Rudzinski, M.; Jezierska, E.; Weyher, J.L.; Macht, L.; Hageman, P.R., et al |
| 2005 | Defects in GaN single crystals and homoepitaxial structures | Weyher, J.L.; Kamler, G.; Nowak, G.; Borysiuk, J.; Lucznik, B., et al |
| 2005 | Defect-selective etching of SiC | Weyher, J.L.; Lazar, S.; Borysiuk, J.; Pernot, J. |
| 2005 | Selective etching and TEM study of inversion domains in Mg-doped GaN epitaxial layers | Kamler, G.; Borysiuk, J.; Weyher, J.L.; Czernecki, R.; Leszczynski, M., et al |
| 2005 | Growth of AlN, GaN and InN from the solution | Krukowski, S.; Grzegory, I.; Bockowski, M.; Lucznik, B.; Suski, T., et al |
| 2004 | TEM observation of nanopipes in heteroepitaxial GaN | Jezierska, E.; Weyher, J.L.; Rudzinski, M.; Borysiuk, J. |
| 2004 | Application of orthodox defect-selective etching for studying GaN single crystals, epitaxial layers and device structures | Kamler, G.; Borysiuk, J.; Weyher, J.L.; Presz, A.; Wozniak, M., et al |
| 2004 | Low dislocation density, high power InGaN laser diodes | Perlin, P.; Leszczynski, M.; Prystawko, P.; Wisniewski, P.; Czernetzki, R., et al |
Showing results 1 to 8 of 8
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